Open Access Journal

ISSN : 2394-2320 (Online)

International Journal of Engineering Research in Computer Science and Engineering (IJERCSE)

Monthly Journal for Computer Science and Engineering

Open Access Journal

IInternational Journal of Engineering Research in Mechanical and Civil Engineering (IJERMCE)

Monthly Journal for Mechanical and Civil Engineering

ISSN : 2456-1290 (Online)

Structural Health Monitoring Through Non-Destructive Evaluation

Author : Tarun Chaudhary 1 Sonali Kumari 2 Lokeshwari M 3 Karthik Shastry 4

Date of Publication :30th November 2017

Abstract: Indian Infrastructure development is very rapid in the present decade. Over the next decade, an estimated $1.5 trillion is required for the development, overhauling and refurbishing of new and existing civil infrastructure. Structural Health Monitoring (SHM) is an essential field for sustainable infrastructure management, which is very relevant as India competes in the global market. It is a known fact that there are numerous new and archaic buildings/ engineering structures that have known or unknown deficiencies, that require immediate attention. It will be too little and too late to wait for a disaster to incur irreparable monetary or human loss. SHM is a multi-disciplinary field where civil, electrical, computer engineering, material science and seismology can work together to increase the durability of such engineering structures. There is a dire need for society for realizing SHM systems that can automatically and quantitatively analyse the real-time condition of building structures. Among many issues, development of sensor technology, damage detection and techniques for modal parameters are the most paramount. Shortcomings of global health monitoring in damage detection have led to increasing demand for localised and Non-Destructive Evaluation techniques for fault detection systems. Relevant non-destructive evaluation (NDE) is based on minimal invasive testing and evaluation of discontinuities, without compromising the integrity of the structure. The latest development in NDE techniques utilizes smart in-situ materials capable of detection and estimation of possible damage incurred in structures due to external factors. Semiconductor nanocrystals with exceptionally advanced properties of photoluminescence and electroluminescence are the promising candidate in the development of such economic systems, for real-time stress and strain analysis. This paper highlights the immense potential of semiconductor nanocrystals as NDE materials to monitor engineering structures.

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